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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 1317.67 PHP
Availability: InStock

Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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The MOLLE sheath is of exceptional quality. Very happy with my purchase.

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TrustScore 4.5 | 7,300+ reviews

Vikram D.

The MOLLE sheath is of exceptional quality. Very happy with my purchase.

2 weeks ago

Neha S.

Excellent communication throughout the order process. Product is perfect.

2 weeks ago

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